The MVPMODEL Procedure

Alt, F. (1985), “Multivariate Quality Control,” in Encyclopedia of Statistical Sciences, volume 6, New York: John Wiley & Sons.

Cooley, W. W. and Lohnes, P. R. (1971), Multivariate Data Analysis, New York: John Wiley & Sons.

Eastment, H. T. and Krzanowski, W. J. (1982), “Cross-Validatory Choice of the Number of Components from a Principal Component Analysis,” Technometrics, 24, 73–77.

Gnanadesikan, R. (1977), Methods for Statistical Data Analysis of Multivariate Observations, New York: John Wiley & Sons.

Hotelling, H. (1933), “Analysis of a Complex of Statistical Variables into Principal Components,” Journal of Educational Psychology, 24, 417–441, 498–520.

Jackson, J. E. (1991), A User’s Guide to Principal Components, New York: John Wiley & Sons.

Kourti, T. and MacGregor, J. F. (1995), “Process Analysis, Monitoring and Diagnosis, Using Multivariate Projection Methods,” Chemometrics and Intelligent Laboratory Systems, 28, 3–21.

Kourti, T. and MacGregor, J. F. (1996), “Multivariate SPC Methods for Process and Product Monitoring,” Journal of Quality Technology, 28, 409–428.

Kshirsagar, A. M. (1972), Multivariate Analysis, New York: Marcel Dekker.

Mardia, K. V., Kent, J. T., and Bibby, J. M. (1979), Multivariate Analysis, London: Academic Press.

McReynolds, W. O. (1970), “Characterization of Some Liquid Phases,” Journal of Chromatographic Science, 8, 685–691.

Miller, P., Swanson, R. E., and Heckler, C. H. E. (1998), “Contribution Plots: A Missing Link in Multivariate Quality Control,” Applied Mathematics and Computer Science, 8, 775–792.

Morrison, D. F. (1976), Multivariate Statistical Methods, Second Edition, New York: McGraw-Hill.

Pearson, K. (1901), “On Lines and Planes of Closest Fit to Systems of Points in Space,” Philosophical Magazine, 6, 559–572.

Rao, C. R. (1964), “The Use and Interpretation of Principal Component Analysis in Applied Research,” Sankhy, Series A, 26, 329–358.

Wold, S. (1978), “Cross-Validatory Estimation of the Number of Components in Factor and Principal Components Models,” Technometrics, 20, 397–405.