Applying Tests Based on General Patterns
/****************************************************************/
/* S A S S A M P L E L I B R A R Y */
/* */
/* NAME: SHWTSC4 */
/* TITLE: Applying Tests Based on General Patterns */
/* PRODUCT: QC */
/* SYSTEM: ALL */
/* KEYS: Shewhart Charts, Test for Special Causes, */
/* PROCS: SHEWHART */
/* DATA: */
/* */
/* REF: SAS/QC Software: Usage and Reference, Version 6, */
/* First Edition, Volume 1 and Volume 2 */
/* */
/****************************************************************/
data Assembly;
length System $ 1 comment $ 16;
label Sample = 'Sample Number';
input System Sample OffsetX OffsetR OffsetN comment $16. ;
datalines;
T 1 19.80 3.8 5
T 2 17.16 8.3 5
T 3 20.11 6.7 5
T 4 20.89 5.5 5
T 5 20.83 2.3 5
T 6 18.87 2.6 5
T 7 20.84 2.3 5
T 8 23.33 5.7 5 New Tool
T 9 19.21 3.5 5
T 10 20.48 3.2 5
T 11 22.05 4.7 5
T 12 20.02 6.7 5
T 13 17.58 2.0 5
T 14 19.11 5.7 5
T 15 20.03 4.1 5
R 16 20.56 3.7 5 Changed System
R 17 20.86 3.3 5
R 18 21.10 5.6 5 Reset Tool
R 19 19.05 2.7 5
R 20 21.76 2.8 5
R 21 21.76 6.4 5
R 22 20.54 4.8 5
R 23 20.04 8.2 5
R 24 19.94 8.8 5
R 25 20.70 5.1 5
Q 26 21.40 12.1 7 Bad Reading
Q 27 21.32 3.2 7
Q 28 20.03 5.2 7 New Gauge
Q 29 22.02 5.9 7
Q 30 21.32 4.3 7
;
ods graphics off;
title 'Analysis of Assembly Data';
proc shewhart history=Assembly;
xrchart Offset * Sample /
mu0 = 20
sigma0 = 2.24
limitn = 5
alln
tests = 1
t( k=14 m=17
lower=0 upper=. scheme=twosided
code=A label='Test A' )
3 4
vaxis = 16 to 26 by 2
split = '/' ;
label OffsetX = 'Avg Offset in cm/Range';
run;