Semiconductor Example
/****************************************************************/
/* S A S S A M P L E L I B R A R Y */
/* */
/* NAME: ISHCHIP */
/* TITLE: Semiconductor Example */
/* PRODUCT: QC */
/* SYSTEM: ALL */
/* KEYS: Ishikawa Diagrams, */
/* PROCS: ISHIKAWA */
/* DATA: */
/* */
/* REF: SAS/QC Software: Usage and Reference, Version 6, */
/* First Edition, Volume 1 and Volume 2 */
/* */
/* MISC: _LCOLOR_ controls the color of the arrows */
/* _ICOLOR_ controls the infill color of the boxes */
/* _TCOLOR_ controls the color of the text */
/* _SWIDTH_ controls the width of the shadow */
/* _STYPE_ controls the shadow type */
/* */
/****************************************************************/
data ishchip;
length _text1_ _text2_ _text3_ $ 40;
length _lcolor_ _tcolor_ _icolor_ $ 8;
input _level_ _text1_ && _text2_ && _text3_ && _relpos_
_lcolor_;
_icolor_ = 'Blue';
_tcolor_ = 'White';
_stype_ = '1';
_swidth_ = 5;
cards;
0 IC Fabrication Faults -1.00 Gray
1 Diffusion Defects . 0.26 Gray
2 Temperature . . 0.12 Gray
2 Atomic Mobility . 0.37 Gray
2 Grain Boundaries . 0.62 Gray
2 Impurities . . 0.87 Gray
1 Bulk & Surface Defects . 0.37 Gray
2 Lattice Defects . 0.16 Gray
2 Impurities . . 0.50 Gray
2 Die Separation . 0.83 Gray
1 Metallization Defects . 0.76 Gray
2 Impurities . . 0.08 Gray
2 Interdiffusion . . 0.25 Gray
2 Cracks/ voids . 0.41 Gray
2 Purple plague . 0.88 Pink
2 Lifting . . 0.75 Pink
2 Electromigration . . 0.58 Gray
1 Oxide Defects . 0.87 Gray
2 Impurities . . 0.12 Gray
2 Leakage . . 0.25 Gray
2 PSG Dissolution . 0.39 Gray
2 Ion Migration . 0.55 Gray
2 Electrical Shorts . 0.70 Gray
2 Hot Carriers . 0.85 Gray
;