There is a new version of this course. Please see JMP®: Statistical Process Control.

This course teaches you how to set up and maintain a statistical process control system using JMP software.

Learn how to

• understand variation
• generate and interpret basic quality charts
• generate and interpret control charts for measurement data
• improve control chart performance
• engineer an SPC system
• calculate and interpret process capability indices
• handle data that does not meet assumptions, such as batch processing, correlated data, attribute data, or multivariate data.

Who should attend

Individuals who want to learn how to use JMP to perform statistical process control

Formats available	Standard Duration (duration can vary, see event schedule for details)
Classroom:	2.0 days

Before attending this course, it is recommended you complete the JMP® Software: A Case Study Approach to Data Exploration course or have equivalent experience.

This course addresses JMP software.

Introduction

• reviewing the historical perspective of SPC
• describing the concept of variation

Control Charts for Measurement Data

• introducing basic quality tools
• building XBar-R, XBar-S Charts
• building X-MR Charts
• understanding additional rules

SPC System Engineering

• understanding response variables
• constructing charts
• using Phase I/Phase II controls
• manufacturing Out-of-Control Action Plan (OCAP)
• using SPC System Monitoring
• calculate the capability of the process

Advanced Topics

• performing batch processing
• creating advanced control charts
• interpreting time series data
• interpreting attribute data
• interpreting multivariate data
• performing analysis of means
• performing real-time data capture