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JMP Software: Measurement Systems Analysis and Variation Reduction

Duration: 1.0 day
Course fee:
EPTO units: .
CEUs: 0.6
Available for on-site training or can be scheduled at any SAS training facility if demand warrants.

This course covers the basic concepts associated with Measurement Systems Analysis (MSA) and variability reduction. Topics include the assessment of repeatability, reproducibility, Gage R&R, bias, linearity, stability, inspection effectiveness, standards selection and use, calibration, compensation, measurement improvement, and control.

Learn how to

Who should attend

Engineers, scientists, and managers who have direct responsibility for measurement evaluation, selection, and control

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Prerequisites
Before attending this course, you should have completed the JMP Software: Statistical Data Exploration course. Other suggested courses include JMP Software: ANOVA and Regression and JMP Software: Classic Design of Experiments However, they are not required.
Course Contents
Introduction to Measurement Systems Analysis (MSA)
  • MSA introduction
  • MSA terms and definitions
Variation Identification and Reduction
  • analysis of variance (ANOVA)
  • variability chart and variance components analysis
  • restricted maximum likelihood (REML)
  • surface variation (contour and surface plots)
Variables Gage Studies
  • evaluating gage repeatability and reproducibility (Gage R&R)
  • evaluating bias and linearity
  • correlation and statistical process control (SPC) for gages
  • destructive and nested gage studies
Attributes MSA Studies
  • MSA for attribute definitions
  • MSA for defective data
  • tests of significance and Kappa
Software
This course addresses JMP.
Course Materials
Students receive a hardcopy of the course notes and, in some courses, can choose to take home a copy of the course data.

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Course fee and EPTO units will differ for on-site training.

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