The GRADAR Procedure

Example 1: Generating the Data Set for the GRADAR Examples

Procedure features:	Data set generation
Sample library member:	GRRDATA

Most of the GRADAR procedure examples use the FAILURE data set. You must submit this code before you can run any of the examples that use the FAILURE data set.

During the manufacture of a metal-oxide semiconductor (MOS) capacitor, different cleaning processes were used by two manufacturing systems that were operating in parallel. Process A used a standard cleaning solution, while Process B used a different cleaning mixture that contained less particulate matter. For five consecutive days the causes of failure with each process were observed, recorded, and saved in the SAS data set called FAILURE.

data failure;
   label  Cause   = "Cause of Failure" ;
   input  Process $ 1-9 Day $ 13-19 Cause $ 23-36 Count 40-41;
   datalines;
Process A   March 1   Contamination    15
Process A   March 1   Corrosion         2
Process A   March 1   Doping            1
Process A   March 1   Metallization     2
Process A   March 1   Miscellaneous     3
Process A   March 1   Oxide Defect      8
Process A   March 1   Silicon Defect    1
Process A   March 2   Contamination    16
Process A   March 2   Corrosion         3
Process A   March 2   Doping            1
Process A   March 2   Metallization     3
Process A   March 2   Miscellaneous     1
Process A   March 2   Oxide Defect      9
Process A   March 2   Silicon Defect    2
Process A   March 3   Contamination    20
Process A   March 3   Corrosion         1
Process A   March 3   Doping            1
Process A   March 3   Metallization     0
Process A   March 3   Miscellaneous     3
Process A   March 3   Oxide Defect      7
Process A   March 3   Silicon Defect    2
Process A   March 4   Contamination    12
Process A   March 4   Corrosion         1
Process A   March 4   Doping            1
Process A   March 4   Metallization     0
Process A   March 4   Miscellaneous     0
Process A   March 4   Oxide Defect     10
Process A   March 4   Silicon Defect    1
Process A   March 5   Contamination    23
Process A   March 5   Corrosion         1
Process A   March 5   Doping            1
Process A   March 5   Metallization     0
Process A   March 5   Miscellaneous     1
Process A   March 5   Oxide Defect      8
Process A   March 5   Silicon Defect    2
Process B   March 1   Contamination     8
Process B   March 1   Corrosion         2
Process B   March 1   Doping            1
Process B   March 1   Metallization     4
Process B   March 1   Miscellaneous     2
Process B   March 1   Oxide Defect     10
Process B   March 1   Silicon Defect    3
Process B   March 2   Contamination     9
Process B   March 2   Corrosion         0
Process B   March 2   Doping            1
Process B   March 2   Metallization     2
Process B   March 2   Miscellaneous     4
Process B   March 2   Oxide Defect      9
Process B   March 2   Silicon Defect    2
Process B   March 3   Contamination     4
Process B   March 3   Corrosion         1
Process B   March 3   Doping            1
Process B   March 3   Metallization     0
Process B   March 3   Miscellaneous     0
Process B   March 3   Oxide Defect     10
Process B   March 3   Silicon Defect    1
Process B   March 4   Contamination     2
Process B   March 4   Corrosion         2
Process B   March 4   Doping            1
Process B   March 4   Metallization     0
Process B   March 4   Miscellaneous     3
Process B   March 4   Oxide Defect      7
Process B   March 4   Silicon Defect    1
Process B   March 5   Contamination     1
Process B   March 5   Corrosion         3
Process B   March 5   Doping            1
Process B   March 5   Metallization     0
Process B   March 5   Miscellaneous     1
Process B   March 5   Oxide Defect      8
Process B   March 5   Silicon Defect    2
run;

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